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Dec 14, 2025
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University of Alberta Calendar 2022-2023 [ARCHIVED CALENDAR]
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ECE 512 - Digital System Testing and Design for Testability
Course Career Graduate
Units 3
Approved Hours 3-0-0
Fee index 6
Faculty Engineering
Department Electrical & Computer Engg
Typically Offered either term
Description
Production testing versus design verification of digital VLSI/ULSI systems. Economics of testing. Defect distributions, yield analysis, and minimum fault coverage requirements. Fault modelling, fault simulation, and automatic test pattern generation. Memory testing. Iddq current-based testing. Design for testability (DFT) rules and strategies. Scan chain based DFT. Built-in self-test (BIST) circuits and architectures. The IEEE JTAG boundary scan and embedded core test standards. Advanced testing topics.
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