CHEM 444 - Characterization Methods in Nanoscience

★ 3 (fi 6) (either term, 3-0-0) Introduction to techniques in determining the composition and structure of materials on the nanometer scale. Characterization of atomic, meso-, and microstructure of materials including impurities and defects. Major topics will include electron microscopy (transmission, scanning, and Auger) and associated spectroscopies (EDX, EELS), surface sensitive spectroscopies (e.g., XPS, AES, IR) and spectrometry (SIMS), synchrotron techniques, X-ray absorption, fluorescence and emission, and scanned probe microscopies (AFM, STM, etc.). The strengths, weaknesses, and complementarity of the techniques used will be examined via case studies on the characterization of real-world nanotechnologies, such as heterogeneous catalysts, surfaces and interfaces in semiconductor devices, organic monolayers on metals and semiconductors, nanotube- and nanowire-based electronics, and biocompatible materials. Prerequisite: 4th year standing or consent of instructor.